LOG IN or SELECT A PURCHASE OPTION:
J. Chem. Phys. 133, 074902 (2010); http://dx.doi.org/10.1063/1.3471583 (7 pages)
Phase-sensitive neutron reflectometry measurements applied in the study of photovoltaic films
(Received 4 May 2010; accepted 5 July 2010; published online 20 August 2010)
© 2010 American Institute of Physics
- EXPERIMENTAL PRELIMINARIES
- Neutron reflectometry
- Experimental objectives
- EXPERIMENTAL SECTION
- Sample preparation
- Phase-sensitive neutron reflectometry
- RESULTS AND DISCUSSION
- Pure component films
- Fast grown film
- Slow grown film
- Effects of reflectivity data truncation
KEYWORDS and PACS
Solar cells (photovoltaics)
ReferencesG. Li, V. Shrotriya, Y. Yao, and Y. Yang, J. Appl. Phys. 98, 043704 (2005)JAPIAU000098000004043704000001.
D. S. Germack, C. K. Chan, B. H. Hamadani, L. J. Richter, D. A. Fischer, D. J. Gundlach, and D. M. DeLongchamp, Appl. Phys. Lett. 94, 233303 (2009)APPLAB000094000023233303000001.
L. G. Parratt, Phys. Rev. 95, 359 (1954).
C. F. Majkrzak and N. F. Berk, Phys. Rev. B 52, 10827 (1995).
C. F. Majkrzak and N. F. Berk, Phys. Rev. B 58, 15416 (1998).
V. O. de Haan, A. A. Vanwell, S. Adenwalla, and G. P. Felcher, Phys. Rev. B 52, 10831 (1995).
For access to citing articles, you need to log in.
Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)