• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

You Tube Flickr Twitter iResearch App Facebook

J. Chem. Phys. 133, 074902 (2010); http://dx.doi.org/10.1063/1.3471583 (7 pages)

Phase-sensitive neutron reflectometry measurements applied in the study of photovoltaic films

J. W. Kiel1,2, M. E. Mackay2, B. J. Kirby3, B. B. Maranville3, and C. F. Majkrzak3

1Department of Chemical Engineering and Materials Science, Michigan State University, East Lansing, Michigan 48824, USA
2Department of Materials Science and Engineering, The University of Delaware, Newark, Delaware 19716, USA
3National Institute of Standards and Technology Center for Neutron Scattering, Gaithersburg, Maryland 20899, USA

View MapView Map

(Received 4 May 2010; accepted 5 July 2010; published online 20 August 2010)

Due to low charge carrier mobilities in polymer-based solar cells, device performance is dictated by the nanoscale morphology of the active layer components. However, their morphological details are notoriously difficult to distinguish due to the low electron contrast difference between the components. Phase-sensitive neutron reflectivity (PSNR) is uniquely suited to characterize these systems due to the large, natural scattering length density difference between two common device materials, poly(3-hexylthiophene) and [6,6]-phenyl-C61-butyric acid methyl ester (PCBM). Using PSNR we find a high concentration of PCBM at the substrate and near but not at the air interface. Herein we discuss the method of applying PSNR to polymer-based solar cells, the results obtained, and an evaluation of its effectiveness.

© 2010 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTAL PRELIMINARIES
    1. Neutron reflectometry
    2. Experimental objectives
  3. EXPERIMENTAL SECTION
    1. Sample preparation
    2. Phase-sensitive neutron reflectometry
  4. RESULTS AND DISCUSSION
    1. Pure component films
    2. Fast grown film
    3. Slow grown film
    4. Effects of reflectivity data truncation
  5. CONCLUSION

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

PACS

ARTICLE DATA

PUBLICATION DATA

ISSN

0021-9606 (print)  
1089-7690 (online)

For access to fully linked references, you need to log in.

    References

    G. Li, V. Shrotriya, Y. Yao, and Y. Yang, J. Appl. Phys. 98, 043704 (2005)JAPIAU000098000004043704000001.

    D. S. Germack, C. K. Chan, B. H. Hamadani, L. J. Richter, D. A. Fischer, D. J. Gundlach, and D. M. DeLongchamp, Appl. Phys. Lett. 94, 233303 (2009)APPLAB000094000023233303000001.

    L. G. Parratt, Phys. Rev. 95, 359 (1954).

    C. F. Majkrzak and N. F. Berk, Phys. Rev. B 52, 10827 (1995).

    C. F. Majkrzak and N. F. Berk, Phys. Rev. B 58, 15416 (1998).

    V. O. de Haan, A. A. Vanwell, S. Adenwalla, and G. P. Felcher, Phys. Rev. B 52, 10831 (1995).


For access to citing articles, you need to log in.


Figures (7)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)


Close
Google Calendar
ADVERTISEMENT

close